Shimadzu Corporation

XRF-1800 X-Ray Floresans Spektrometre (Sequential)

XRF 1800 Wavelength dispersive systems, which provide outstanding detection of trace substances from sub-ppm-level to 100 %., enables  the analysis of elements from Beryllium  (Be) to Uranium (U). Since samples can be analyzed non-destructively and without contacting the sample, X-ray fluorescence spectrometers can be used for a wide range of applications, regardless of whether the sample is a solid, liquid, powder or other form.

The XRF-1800 provides local analysis and 250 μm mapping capabilities as standard features, enabling reliable analysis of only a 500 μm in diameter for content distribution and intensity distribution analyses of non-uniform samples.
  • Iron and Steel Industry
  • Non-ferrous metals, Ceramics
  • Chemicals, Catalysts, Polymers
  • Pharmaceuticals and Medical treatment
  • Environment and Industrial wastes
  • Electronics and Magnetic Materials
  • Petroleum and Coal Industry
  • Agriculture and Food Industry

  • World-first 250 μm mapping for wavelength dispersive analysis [Patented]
  • Optional sample observation by CCD camera.
  • Qualitative/quantitative analysis using higher-order X-rays. [Patented]
  • Film thickness measurement with the background FP method. [Patented]
  • Smart, small-footprint design
  • 4 kW thin-window X-ray tube offers high reliability and long life.
  • Tried-and-tested sample loading system [Patented]
  • Ultra-fast scanning (300°/min.) for quick and easy qualitative/quantitative analysis.
  • Full-featured, easy-to-use software.

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