SPM-9600
Scanning Probe Microscope

The Scanning Probe Microscope (SPM) is an instrument that can visualize the sample surface in great detail by positioning a very small lever (cantilever) close to a sample surface and measuring the detected force (atomic force) between the cantilever and sample surface.

Metals, semi-conductors, ceramics, organic matter, high molecular weight polymers, as well as biological samples can be visualized without initial coating, with surface features displayed at magnifications up to millions fold.

SPM-9600 is a highly easy-to-use system with its Windows® software. Featuring a patented head-slide mechanism (Japan patent 2833491), the standard-type head can accept samples up to a diameter of 24mm x 8mm by simply placing the sample on the head .

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WET-SPM Series
Environment Controlled
By adding the Shimadzu Environment Controlled chamber to the Scanning Probe Microscope SPM-9600 Series, the system is upgraded to the environment controlled SPM (WET-SPM). A unique feature of the SPM-9600 is the emphasis on working inside the chamber, including Shimadzu’s unique sample replacement mechanism, operation from the front panel, fully-automatic approach, and open-head design. Adding the option for in-situ SPM permits real time investigation of surface changes in physical parameters such as temperature, humidity, pressure, luminescence, and concentration.


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