Incorporating a new high-performance semiconductor detector, high end EDX-7000/8000 spectrometers offer excellent sensitivity, resolution, and throughput for an array of applications, from general screening analysis to advanced materials research.
The EDX-7000 provides a measurement range of 11Na to 92U, while the EDX-8000 has a range of 6C to 92U. Both systems are equipped with five primary filters that enable highly sensitive analysis of trace elements and a sample observation camera for precise sample positioning. A large sample chamber accommodates virtually any sample type small or large, including thin films, powders, slurries, emulsions and liquids.
When combined with optimized optics and five primary filters, the EDX-7000/8000 spectrometers achieve unprecedented levels of sensitivity and energy resolution The EDX-7000/8000 systems’ new state-of-the-art Silicon drift detector (SDD) offers a high speed and high sensitivity. In addition, since it is electronically cooled, the SDD does not require liquid nitrogen.. Optional equipment includes a vacuum measurement unit and helium purge unit for highly sensitive measurement of light elements and a 12-sample turret for automated continuous measurements.