Shimadzu Corporation

AXIS SUPRA/NOVA X-Ray Photoelectron Spectrometers (XPS)

AXIS SupraTM is an X-ray photoelectron spectrometer (XPS) with unrivalled automation and ease of use for materials surface characterisation.  The patented AXIS technology ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode.  XPS spectroscopy and imaging results can be complemented by additional surface analysis techniques such as: ultraviolet photoemission spectroscopy (UPS); Schottky field emission scanning Auger microscopy (SAM) and secondary electron microscopy (SEM) and ion scattering spectroscopy (ISS).  The AXIS Supra replaces the AXIS Ultra DLD as Kratos’ flagship x-ray photoelectron spectrometer.

  • Large Area, High Sensitivity, Ultimate Large Area Performance
  • Parallel Imaging&Spectra from images
  • Selected Area Spectroscopy
  • Ion Sputter Depth Profiling
  • Ion Source Options

Recommend Me a System

Please Recommend Me a Column