Incorporating a new high-performance semiconductor detector, high end EDX-7000/8000 energy dispersive spectrometers offer excellent sensitivity, resolution, and throughput for an array of applications, from general screening analysis to advanced materials research.
The EDX-7000 provides a measurement range of 11Na to 92U, while the EDX-8000 has a range of 6C to 92U. Both systems are equipped with five primary filters that enable highly sensitive analysis of trace elements and a sample observation camera for precise sample positioning. A large sample chamber accommodates virtually any sample type small or large, including thin films, powders, slurries, emulsions and liquids.
When combined with optimized optics and five primary filters, the EDX-7000/8000 spectrometers achieve unprecedented levels of sensitivity and energy resolution The EDX-7000/8000 systems’ new state-of-the-art Silicon drift detector (SDD) offers a high speed and high sensitivity. In addition, since it is electronically cooled, the SDD does not require liquid nitrogen.. Optional equipment includes a vacuum measurement unit and helium purge unit for highly sensitive measurement of light elements and a 12-sample turret for automated continuous measurements.
Installed width is 20% smaller than the previous instrument due to its compact body size.
The EDX-7000/8000/8100 can accommodate samples up to a maximum size of W300 x D275 x approx. H100 mm.
When X-rays are generated, an X-ray indicator at the rear of the instrument and an X-RAYS ON lamp at the front turn on, so that the instrument status can be monitored even from a distance.
The high-performance SDD detector and combination of optimized optics and primary filters achieve previously unheard-of high levels of sensitivity. The sensitivity is higher than the previous Si (Li) semiconductor detector across the entire range from light to heavy elements.
The high fluorescent X-ray count per unit time (high count rate) of the SDD detector permits highly precise analysis in a shorter measurement time. This feature is achieved to the maximum when analyzing samples that generate a lot of fluorescent X-rays, such as samples with a metal as the Main component element.
The EDX-8000/8100 features an SDD detector with a special ultra-thin-film window material that is able to detect ultra-light elements such as carbon (C), oxygen (O), and fluorine (F).
Automatic collimator switching in four stages: 1, 3, 5, and 10 mm diameter
Select the irradiation chamber from four values to suit the sample size.
Select the most appropriate irradiation diameter for the sample shape: 1 mm diameter for trace foreign matter analysis or defect analysis; 3 mm or 5 mm diameter for small sample volumes.
Sample observation camera included standard
Use the sample observation camera to confirm the X-ray irradiation position on a specific position to measure small samples, samples comprising multiple areas, or when using a Micro X-Cell.
The collimators and primary filters are driven independently and can be combined to address specific requirements. Select the optimal combination from 24 (6 filters x 4 collimators) available options.
Quantitative analysis using the FP method is possible with all combinations.
Sensitivity for light elements can be increased by removing atmosphere. Two options are available: a vacuum measurement unit and a helium purge unit.
The helium purge unit is effective when measuring liquid samples and samples that generate a gas and cannot be measured in a vacuum.
Relative Sensitivity of Measurements with Helium Purging and in Air(sensitivity in vacuum = 100)
Profile Comparison in Vacuum and Air (sample: soda-lime glass)
The addition of the turret allows automated continuous measurements. It improves throughput, especially for measurements in a vacuum or helium atmosphere.
In this study, Energy Distribution X-Ray Fluorescence Spectrometer (EDX) system with Quartzite Specimen Determination of the application is given.
Instrument: Shimadzu EDX-720 Energy Distributed X-Ray Fluorescence Spectrometer
In this study, ED-XRF and WEEE & RoHS (Electrical and Electronic Equipment) and ELV directives are analyzed.
Instrument: Shimadzu EDX-7000 Energy Dispersive X-Ray Fluorescence Spectrometer (EDX)In this study, the application of heavy element determination in textile samples with X-Ray Fluorescence Spectrometer (EDX) system is given.
Instrument: Shimadzu EDX-7000 Energy Dispersive X-Ray Fluorescence Spectrometer (EDX)New Energy
Pharmaceuticals and Human Science: This issue focuses on Pharmaceuticals and Human Science, and contains such articles as follows:
An interview with Professor van Breemen, who is studying medicinal properties of natural products at the University of Illinois, College of Pharmacy, in Chicago, using advanced mass spectrometry
Professor van Breemen's latest work of the effect of human exposure to bisphenol A in the environment
Two interviews with Japanese pharmaceutical companies about Shimadzu's new technologies i-PDeA and i-DReC and technical reports of each technology
In addition, it contains information on other applicable topics, as well as the latest news and applications.
Various methods such as ICP and X-ray spectrometry are widely used in the analysis of tin (Sn) element which is used in many industries such as electric-electronic, plastic, packaging, glass, textile. The purpose of this study is to analyse Tin element in plastic (PE) samples at the determined LOD value using EDX spectrometry, which is a non-destructive method requiring no sample preparation.
Instrument: Shimadzu EDX-7000 Energy Dispersive X-Ray Fluorescence Spectrometer (EDX)
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